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Advantages of the X-32
FASTER inspections:
Simultaneous multi-angle
and multi-depth inspection with one probe
Reduced manual movement
for a greater inspected volume
Reduced inspection time
Reduced personnel exposure
to radiation
EASIER inspections:
Hand-held and lightweight
instrument
Intuitive, user-friendly
interface
Real-time imaging,
including Top Projected View
Fastest sectorial Scan
rendering of the industry
MORE RELIABLE inspections:
32 active elements for
high volume resolution to precisely size and map flaws.
Up to 2000 focal laws for
maximum coverage with maximum resolution.
Full programmability for
better and flexible inspection of complex geometry.
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